Thin Film Materials

Stress, Defect Formation and Surface Evolution

Autori

• L. B. Freund
• S. Suresh

Parametri

• 770 pagine
• 27 ore di lettura

• Scienza
• Tecnologia

Maggiori informazioni sul libro

This book provides comprehensive coverage of stress, defect formation and surface evolution in thin films. With its balanced coverage of theory, experiment and simulation and many homework problems, the text will be essential reading in senior undergraduate and graduate courses on thin films.

Lingua: Inglese

Pubblicato: 2004

(In brossura)