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NanoScience and Technology: Atomic Force Microscopy

Second Edition

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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer

Lingua
Pubblicato
2019
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(Copertina rigida),
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67,99 €

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Titolo
NanoScience and Technology: Atomic Force Microscopy
Sottotitolo
Second Edition
Lingua
Inglese
Editore
Springer
Pubblicato
2019
Formato
Copertina rigida
Pagine
345
ISBN10
3030136531
ISBN13
9783030136536
Serie
Valutazione
5 su 5
Descrizione
The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.