Modelling of leakage currents induced by extended defects in extra-functionality devices

Autori

• Artur Scheinemann

Parametri

• Libri di testo
• Libri di testo universitari
• Series in microelectronics

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Topic of the presented thesis is the development of a Deep Level Transient Spectroscopy (DLTS) simulator combining the convenient state-of-the-art computation of electrostatics in devices with the flexibility of a completely independent C++ - code, to validate and test the implications of different models for the capture and emission of electrans and holes to a defect state. Conclusions about the electrical nature of defects obtained fram the comparison of DLTS simulations and measurements can subsequently be used to refine the simulation of leakage currents.

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Lingua: Inglese

Pubblicato: 2014