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Focusing on the physical process of electromigration, this book delves into its impact on electronic circuit reliability. It offers insights into effective countermeasures and presents a range of modifications to current integrated circuit design methodologies aimed at preventing electromigration. Additionally, the authors explore ways to leverage specific effects in both current and future technologies to mitigate the adverse effects of electromigration, enhancing circuit reliability and performance.
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Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig, Matthias Thiele
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- Pubblicato
- 2018
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