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Book of abstracts / 10th CIRP Conference on Computer Aided Tolerancing, Specification and Verification for Assemblies

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Research in metrology and tolerancing is crucial for design, manufacturing, and quality control. Recent advancements in dimensional and geometrical metrology and tolerancing have emerged due to global shifts in production technology and heightened demands for economy and safety. Innovations include the adoption of optical and robust methods for enhanced accuracy, the expansion of coordinate measuring techniques beyond tactile methods, and the introduction of new procedures for sub-nanometer resolution measurements. To ensure the significance of measurement results, efforts are focused on global traceability and standardized strategies for evaluating measurement uncertainty. Additionally, computer-assisted and web-based education in metrology highlights the operator's impact on measurement outcomes. New approaches to geometrical tolerancing have also been developed, particularly for assemblies where individual part tolerances can accumulate or interact. Modern simulation tools aid in tolerancing, ensuring the functionality of assembly groups. Advanced procedures are necessary to accommodate the flexibility of subassemblies and address the unique challenges posed by the rapidly evolving fields of micro and nano technology. The Conference showcases advancements in metrology and geometrical tolerancing, discussing their implications for science, industry, and engineering, while fostering collaboration among researchers and special

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Book of abstracts / 10th CIRP Conference on Computer Aided Tolerancing, Specification and Verification for Assemblies, Albert Weckenmann

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2007
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