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Focusing on automated debugging, the book presents innovative techniques for identifying and resolving bugs across various abstraction levels in hardware systems. It introduces a transaction-based approach for transaction-level debugging and offers methods to detect design, logic, and synchronization bugs at RTL and gate levels. Additionally, it addresses electrical faults, particularly delay faults, by pinpointing failing speed paths. These approaches enhance diagnosis accuracy and significantly reduce debugging time, ultimately streamlining the integrated circuit development process and boosting designer productivity.
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Debug Automation from Pre-Silicon to Post-Silicon, Mehdi Dehbashi, Görschwin Fey
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- Pubblicato
- 2016
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