Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Autori

• Wilhelm Warta
• Otwin Breitenstein
• Martin Langenkamp

Parametri

• Architettura e urbanistica
• Costruzione e Statica
• Hobby

Maggiori informazioni sul libro

"Lock-in Thermography" delves into advanced infrared measurement systems for analyzing electronic materials, particularly solar cells. The updated edition covers new techniques like Illuminated Lock-In Thermography and Carrier Density Imaging, enhancing spatial resolution and providing innovative timing strategies for improved analysis.

Lingua: Inglese

Pubblicato: 2010