Il libro è attualmente esaurito

Fundamentals of Electromigration-Aware Integrated Circuit Design

Autori

Parametri

Pagine: 176pagine
Tempo di lettura: 7ore

Computer, IT, programmazione

Maggiori informazioni sul libro

Focusing on electromigration, the book explores its impact on the reliability of electronic circuits. It details the physical processes involved, equipping readers with the knowledge needed to implement effective countermeasures. A variety of strategies for adapting current integrated circuit design methodologies to mitigate electromigration are presented. Additionally, the authors demonstrate how certain effects can be harnessed in existing and emerging technologies to minimize the detrimental effects on circuit reliability.

Pubblicazione

Acquisto del libro

Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig, Matthias Thiele

Lingua
Pubblicato: 2018
product-detail.submit-box.info.binding: (In brossura)

Ti avviseremo via email non appena lo rintracceremo.

Metodi di pagamento

Ancora nessuna valutazione.Aggiungi una valutazione

Titolo: Fundamentals of Electromigration-Aware Integrated Circuit Design
Lingua: Inglese
Autori: Jens Lienig, Matthias Thiele
Editore: Springer International Publishing
Pubblicato: 2018
Formato: In brossura
Pagine: 176
ISBN13: 9783030088118
Tag: Computer, IT, programmazione
Descrizione: Focusing on electromigration, the book explores its impact on the reliability of electronic circuits. It details the physical processes involved, equipping readers with the knowledge needed to implement effective countermeasures. A variety of strategies for adapting current integrated circuit design methodologies to mitigate electromigration are presented. Additionally, the authors demonstrate how certain effects can be harnessed in existing and emerging technologies to minimize the detrimental effects on circuit reliability.