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Focusing on advanced optical techniques, this book explores their role in revealing the electronic and structural properties of semiconductor and metal surfaces, as well as multilayer samples. It emphasizes nonlinear optics and dynamical processes through pump-probe methods, while also investigating new optical sources. Additionally, it highlights innovative applications of scanning probe microscopy for material science and biological samples, particularly in relation to silicon, semiconductor-metal interfaces, and III-V compound semiconductors.
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EPIOPTICS-11, Antonio Cricenti
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- 2012
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