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Focusing on material analysis using ion beams, the conference held in Karlsruhe highlighted advanced techniques such as backscattering, channeling, and ion-induced X-rays. With 7 invited papers and 85 contributions from 150 participants across 21 countries, discussions were organized into sessions on fundamental aspects, analytical problems, and applications. This gathering underscored the growing interest and established methodologies in ion beam surface layer analysis, with proceedings documenting all contributions and summaries available separately.
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Ion Beam Surface Layer Analysis, Otto Meyer
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- 2012
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