Ullrich Pietsch Libri

This book explores the growing interest in high-resolution x-ray diffractometry and reflectivity, driven by advancements in the semiconductor industry and material research. It focuses on the significance of thin layers in optoelectronics, their interface quality, and the unique properties of thin metallic layers, including colossal magnetoresistance.

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.