Parametri
- 689pagine
- 25 ore di lettura
Maggiori informazioni sul libro
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Acquisto del libro
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Lingua
- Pubblicato
- 2003
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- (Copertina rigida),
- Condizioni del libro
- In buone condizioni
- Prezzo
- 10,49 €
Metodi di pagamento
Ancora nessuna valutazione.
- Sottotitolo
- Third Edition
- Lingua
- Inglese
- Autori
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Editore
- Springer
- Pubblicato
- 2003
- Formato
- Copertina rigida
- Pagine
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Serie
- Tag
- Saggistica, Libri di testo, Tecnologia & Ingegneria, Salute & Medicina, Scienza e Matematica, Manuali e guide, Altri libri di testo, Studi di medicina
- Descrizione
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.